| 10:00 |
Opening Remark |
| 10:10 |
Introduction of VDEC D2T Group |
| 10:20 |
Invited Talks (1) |
|
Test's Changing Role in the Late-Silicon Era
Tim Cheng (University of California, Santa Barbara) |
|
IFRA: Instruction Footprint Recording and Analysis for Post-Silicon Validation of Robust Systems
Subhasish Mitra (Stanford University) |
| 11:50 |
Lunch |
| 13:00 |
Invited Talks (2) |
|
Testing of 3D Integrated Circuits: Challenges and Emerging Solutions
Krishnendu Chakrabarty (Duke University) |
|
Issues and Challenges of Analog Circuit Testing in Mixed-Signal SOC
Haruo Kobayashi (Gunma University) |
| 14:30 |
Break |
| 15:00 |
Research Report of VDEC D2T Group |
|
A Characteristic Function Based Method for Identifying a Deterministic Jitter Model in a Total Jitter Distribution
Takahiro Yamaguchi (Advantest Corporation) |
|
Signature-Based Testing for Adaptive Mixed-Signal Systems
Mohamed Abbas (University of Tokyo) |
| 16:00 |
Break |
| 16:30 |
Invited Talks (3) |
|
Manufacturing Test of Nanometer Integrated Circuits
Shawn Blanton (Carnegie Mellon University) |
|
On Compositional Observational Equivalence Checking of Hardware
Zurab Khasidashvili (Intel Haifa) |
| 18:00 |
Banquet |