| 10:00 | Opening Remark |
| 10:10 | Introduction of VDEC D2T Group |
| Introduction and Activities of D2T Research Division Satoshi Komatsu (University of Tokyo) |
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| 10:20 | Research Activity of VDEC D2T Group |
| Cost-Effective Test Methodology for Analog and Mixed-Signals in SoCs Mohamed Abbas (University of Tokyo) |
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| 11:05 | Invited Talk (1) |
| Board-Level Fault Diagnosis Methods to Target No-Trouble-Found Failures Krishnendu Chakrabarty (Duke University) |
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| 11:50 | Lunch |
| 13:30 | Invited Talk (2) |
| A Tool Chain for Dependable VLSI Design - A challenge to soft-error tolerant
VLSI Systems - Hiroto Yasuura (Kyushu University) |
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| Ultra Dependable VLSI Processor Architecture Shuichi Sakai (University of Tokyo) |
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| 15:00 | Break |
| 15:30 | Invited Talk (3) |
| Robust System Design in Scaled CMOS and Beyond Subhasish Mitra (Stanford University) |
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| Enabling Robust Systems through On-Line Test and Diagnosis Shawn Blanton (Carnegie Mellon University) |
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| 17:00 | Break |
| 17:30 | Panel Discussion "Dependable VLSI Systems" |
| Moderator: Masahiro Fujita (University of Tokyo) Panelists: Krishnendu Chakrabarty (Duke University) Subhasish Mitra (Stanford University) Shawn Blanton (Carnegie Mellon University) Hiroto Yasuura (Kyushu University) Shuichi Sakai (University of Tokyo) Shojiro Asai (Rigaku Corporation) |
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| 18:30 | Closing |
VLSI Design and Education Center (VDEC), The University of Tokyo