| 10:00 | Opening |
| 10:30 | Introduction of VDEC D2T Group |
| Introduction and Activities of D2T Research Division Satoshi Komatsu (University of Tokyo) |
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| 10:50 | Invited Talk (1) |
| Automated Debugging - Between Localization and Explanation of Bugs Goerschwin Fey (Bremen University) |
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| 11:30 | Research Activity of VDEC D2T Group |
| High-speed clocked comparator for on-chip signal monitoring applications Mohamed Abbas (Assiut University/University of Tokyo) Takahiro Yamaguchi (Advantest Laboratories) |
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| 12:10 | Lunch |
| 13:30 | Special Invited Talk |
| 3D Imaging and Analysis System Using Terahertz Waves Eiji Kato, Motoki Imamura (Advantest Corporation) |
|
| 14:10 | Invited Talk (2) |
| 3D Power Ground Network Analysis Chung-Kuan Cheng (University of California, San Diego) |
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| 14:50 | Break |
| 15:20 | Invited Talk (3) |
| Post-Silicon Validation of Robust Systems Subhasish Mitra (Stanford University) |
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| Coverage Metrics for Post-Silicon Validation Kwang-Ting(Tim) Cheng (University of California, Santa Barbara) |
|
| 16:40 | Break |
| 17:00 | Panel Discussion "Testing future VLSI systems: short-, mid-, and long-term challenges and solutions" |
| Moderator: Kwang-Ting(Tim) Cheng (University of California, Santa@Barbara) Panelists: Chung-Kuan Cheng (University of California, San Diego) Subhasish Mitra (Stanford University) Goerschwin Fey (Bremen University) Takahiro Yamaguchi (Advantest Laboratories) |
|
| 18:00 | Closing |
| 18:10 | Banquet |
VLSI Design and Education Center (VDEC), The University of Tokyo