| 10:00 |
Opening |
| 10:15 |
Introduction of VDEC D2T Group |
|
Recent Activities of D2T Research Division
Satoshi Komatsu (University of Tokyo) |
| 10:30 |
Session 1 |
|
3D TSV Test: Myths, Challenges, and Solutions
Erik H. Volkerink (Verigy US Inc. _ Advantest Group) |
|
Application of a Continuous-Time Level Crossing Quantization Method for
Timing Noise Measurements
Takahiro Yamaguchi (Advantest Laboratories) |
| 11:50 |
Lunch |
| 13:00 |
Session 2 |
|
Electron beam lithography: history, issues, and challenges
Masaki Yamabe (Fujitsu Semiconductor Ltd.) |
|
EB Direct Writing Technology for Device Production with Character Projection Function
Takashi Maruyama (e-Shuttle Inc.) |
|
Nanotechnet club: Ultra-short turn-around-time MEMS Research by EB Direct
Writing Environment in Takeda Cleanroom
Yoshio Mita (University of Tokyo) |
| 15:00 |
Break |
| 15:30 |
Session 3 |
|
High-speed digital I/O characterization with ATE: is there a future?
Jose-Antonio Moreira (Verigy, Advantest Group) |
|
Real-Time Testing Method for High-Speed Multi-Level Signal Interface
Masahiro Ishida (Advantest) |
| 16:50 |
Closing |
| 17:00 |
Reception |