The 10th VDEC D2T Symposium, The University of Tokyo

August 21st (Fri.), 2015
Takeda-Hall, 5th floor of Takeda Building, The University of Tokyo

(日本語版, Japanese page)

News：

- This symposium was successfully finished. Thank you. (2015/8/21)
- Abstract of presentations is available. (2015/7/27)
- The symposium program is updated. (2015/7/3)
- Registration is started. (2015/6/15)
- The symposium program is disclosed. (2015/6/15)
- The symposium homepage is opened. (2015/5/22)

Symposium Overview

Organizer VLSI Design and Education Center (VDEC), The University of Tokyo
Sponsor ADVANTEST Corporation
Supporters The Institute of Electronics, Information and Communication Engineers (IEICE)
Information Processing Society of japan (IPSJ)
IEEE SSCS Japan Chapter
The Study Group of the integrated MEMS, JSAP
The Institute of NANO Testing (INANOT)
Japan Electronics and Information Technology Industries Association (JEITA)
SEMI Japan
Power Device Enabling Association (PDEA)
Admission fee Not required

Symposium Program (日本語版, Japanese version)

10:00 Opening remarks
10:15 Session 1
High reliability and process control technique of LSI for Automotive product [Invited]
Takashi Setoya (Toshiba, JEITA)
Cross-layer Resilient Design for Automotive Electronics [Invited]
Mehdi B. Tahoori (Karlsruhe Institute of Technology)
11:45 Lunch break
13:00 Session 2
Robust Systems: Overcoming Complexity and Reliability Challenges [Invited]
Subhasish Mitra (Stanford University)
Advanced Modeling and Characterization of Bias Temperature Instabilities and Hot Carrier Degradation [Invited]
Tibor Grasser (TU Wien)
14:30 Coffee break
15:00 Session 3
Activities of VDEC Advantest D2T Reseach Division
池野理門 (東京大学VDEC)
FET-R-C Circuits: A Unified Treatment
Tetsuya Iizuka (VDEC, The University of Tokyo)
A Novel Circuit for Transition-Edge Detection
Takahiro Yamaguchi (Advantest Labolatories)
Dynamic Power Integrity Control of ATE for Eliminating Overkills and Underkills
Masahiro Ishida (Advantest Coorporation)
16:25 Short break
16:40 Panel Discussion
Theme: Reliability / dependability of industrial standards for automotive systems
Moderator: Masahiro Fujita (The University of Tokyo)
Panelists: To be announced. Tomohiro Yoneda (National Institute for Informatics), Takao Futagami (Toyo Corporation), Mehdi B. Tahoori (Karlsruhe Institute of Technology)
18:00 Closing remarks
Reception

Registration (Free）

This symposium is over. Thank you.

Access to the Symposium

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Contact

ADVANTEST D2T Research Divison,
VLSI Design and Education Center (VDEC), The University of Tokyo
Room 404, Takeda Building, Yayoi 2-11-16, Bunkyo-ku, Tokyo, 113-0032, Japan
Tel: +81-3-5841-0233 FAX: +81-3-5841-1093
E-mail: ikeno[at]vdec.u-tokyo.ac.jp

VLSI Design and Education Center (VDEC), The University of Tokyo